Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
José Alberto Peixoto Machado da Silva
AuthID:
R-000-7Z3
Publicações
Confirmadas
Para Validar
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (52)
Article (21)
Book Chapter (6)
Editorial Material (2)
Review (2)
Note (1)
Unpublished (1)
Year Start - End:
1989
1990
1991
1992
1993
1994
1995
1996
1997
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
-
2024
2023
2022
2021
2020
2019
2018
2017
2016
2015
2014
2013
2012
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
1996
1995
1994
1993
1992
1991
1990
1989
Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
30
40
50
Confirmed Publications: 85
71
TITLE:
Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure
Full Text
AUTHORS:
da Silva, JM
; Leao, AC;
Alves, JC
;
Matos, JS
;
PUBLISHED:
1997
,
SOURCE:
International Test Conference 1997 (ITC)
in
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
72
TITLE:
Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS:
Machado da Silva, J
;
Silva Matos, J
;
PUBLISHED:
1997
,
SOURCE:
Proceedings of 1997 IEEE International Symposium on Circuits and Systems. Circuits and Systems in the Information Age ISCAS '97
INDEXED IN:
CrossRef
IN MY:
ORCID
73
TITLE:
Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS:
daSilva, JM
;
Matos, JS
;
PUBLISHED:
1997
,
SOURCE:
1997 IEEE International Symposium on Circuits and Systems (ISCAS 97) - Circuits and Systems in the Information Age
in
ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE,
VOLUME:
4
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
74
TITLE:
Evaluation of i(DD)/V-OUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits
Full Text
AUTHORS:
daSilva, JM
;
Matos, JS
;
PUBLISHED:
1996
,
SOURCE:
European Design and Test Conference
in
EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
75
TITLE:
Evaluation of iDD/vOUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits
AUTHORS:
Machado Da Silva, J
;
Silva Matos, J
;
PUBLISHED:
1996
,
SOURCE:
1996 European Conference on Design and Test, EDTC 1996
in
Proceedings of the 1996 European Conference on Design and Test, EDTC 1996
INDEXED IN:
Scopus
CrossRef
:
1
IN MY:
ORCID
76
TITLE:
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
AUTHORS:
DaSilva, JM
;
Matos, JS
; Bell, IM; Taylor, GE;
PUBLISHED:
1996
,
SOURCE:
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
VOLUME:
9,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
77
TITLE:
Supply current test of analogue and mixed signal circuits
AUTHORS:
Bell, IM; Spinks, SJ;
daSilva, JM
;
PUBLISHED:
1996
,
SOURCE:
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS,
VOLUME:
143,
ISSUE:
6
INDEXED IN:
Scopus
WOS
CrossRef
:
21
IN MY:
ORCID
78
TITLE:
Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS:
daSilva, JM
;
Matos, JS
; Bell, IM; Taylor, GE;
PUBLISHED:
1996
,
SOURCE:
38th Midwest Symposium on Circuits and Systems
in
38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2
INDEXED IN:
WOS
IN MY:
ORCID
79
TITLE:
CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOG CIRCUITS
AUTHORS:
DASILVA, JM
;
MATOS, JS
; BELL, IM; TAYLOR, GE;
PUBLISHED:
1995
,
SOURCE:
ELECTRONICS LETTERS,
VOLUME:
31,
ISSUE:
19
INDEXED IN:
Scopus
WOS
CrossRef
:
9
IN MY:
ORCID
80
TITLE:
Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS:
Machado M da Silva
;
Silva S Matos
;
Bell Ian, M
; Taylor Gaynor, E;
PUBLISHED:
1995
,
SOURCE:
Proceedings of the 1995 IEEE 38th Midwest Symposium on Circuits and Systems. Part 1 (of 2)
in
Midwest Symposium on Circuits and Systems,
VOLUME:
2
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
Adicionar à lista
Marked
Marcar Todas
Export
×
Publication Export Settings
BibTex
EndNote
APA
CSV
PDF
Export Preview
Print
×
Publication Print Settings
HTML
PDF
Print Preview
Página 8 de 9. Total de resultados: 85.
<<
<
1
2
3
4
5
6
7
8
9
>
>>
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service