111
TÍTULO: Structure determination of (Ti,Al)N/Mo multilayers  Full Text
AUTORES: Tavares, CJ ; Rebouta, L ; Alves, EJ ;
PUBLICAÇÃO: 2000, FONTE: 11th International Conference on Thin Films (ICTF-11) in THIN SOLID FILMS, VOLUME: 373, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
112
TÍTULO: Surface studies of SiC/SiCf composites exposed to relevant fusion reactor conditions  Full Text
AUTORES: Alves, LC ; Paul, A; Alves, E ; da Silva, MF; Soares, JC; Rebouta, L ; La Barbera, A; Riccordi, B; Centeno, MA; Odriozola, JA;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
113
TÍTULO: Characterization of titanium silicon nitride films deposited by PVD  Full Text
AUTORES: Vaz, F ; Rebouta, L ; da Silva, RMC; da Silva, MF; Soares, JC ;
PUBLICAÇÃO: 1999, FONTE: 2nd European Conference on Hard Coatings (ETCHC-2)/3rd Iberian Vacuum Meeting (3rd RIVA) in VACUUM, VOLUME: 52, NÚMERO: 1-2
INDEXADO EM: Scopus WOS CrossRef
114
TÍTULO: Combined ion bean and hyperfine interaction studies of LiNbO3 single crystals
AUTORES: Marques, JG; Kling, A; Rebouta, L ; da Silva, MF; Soares, JC;
PUBLICAÇÃO: 1999, FONTE: Workshop on Ion and Slow Positron Beam Utilisation in PROCEEDINGS OF THE WORKSHOP ON ION AND SLOW POSITRON BEAM UTILISATION
INDEXADO EM: WOS
115
TÍTULO: Corrosion of CrN and TiAlN coatings in chloride-containing atmospheres  Full Text
AUTORES: Cunha, L ; Andritschky, M ; Rebouta, L ; Pischow, K;
PUBLICAÇÃO: 1999, FONTE: 6th International Conference on Plasma Surface Engineering (PSE 98) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 116
INDEXADO EM: Scopus WOS CrossRef
116
TÍTULO: Determination of impurity lattice sites in single crystals using PIXE channeling  Full Text
AUTORES: Kling, A ; Soares, JC ; da Silva, MF; Rebouta, L ; Kollewe, D; Krause, H; Flagmeyer, RH; Vogt, J;
PUBLICAÇÃO: 1999, FONTE: X-RAY SPECTROMETRY, VOLUME: 28, NÚMERO: 2
INDEXADO EM: Scopus WOS CrossRef
117
TÍTULO: Mechanical characterisation of TiN/ZrN multi-layered coatings  Full Text
AUTORES: Tavares, CJ ; Rebouta, L ; Andritschky, M ; Ramos, S ;
PUBLICAÇÃO: 1999, FONTE: Proceedings of the 1997 Advances in Materials and Processing Technologies, AMPT'97 in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 93
INDEXADO EM: Scopus WOS CrossRef
118
TÍTULO: Photothermal characterization of sputtered thin films and substrate treatment
AUTORES: Macedo, F; Ferreira, J; Vaz, F ; Rebouta, L ; Daoud, AH; Dietzel, D; Bein, BK;
PUBLICAÇÃO: 1999, FONTE: 10th International Conference on Photoacoustic and Photothermal Phenomena in PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA: TENTH INTERNATIONAL CONFERENCE, VOLUME: 463
INDEXADO EM: WOS CrossRef: 2
119
TÍTULO: Structural analysis of Ti1-xSixNy nanocomposite films prepared by reactive magnetron sputtering  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Almeida, B ; Goudeau, P; Pacaud, J; Riviere, JP; Sousa, JBE;
PUBLICAÇÃO: 1999, FONTE: 26th International Conference on Metallurgical Coating and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 120
INDEXADO EM: Scopus WOS CrossRef
120
TÍTULO: The effect of the addition of Al and Si on the physical and mechanical properties of titanium nitride  Full Text
AUTORES: Vaz, F ; Rebouta, L ; Andritschky, M ; da Silva, MF; Soares, JC ;
PUBLICAÇÃO: 1999, FONTE: Proceedings of the 1997 Advances in Materials and Processing Technologies, AMPT'97 in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 93
INDEXADO EM: Scopus WOS CrossRef
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