A. J. M. M. Weijters
AuthID: R-00F-SMA
1
TÃTULO: Event cube: Another perspective on business processes
AUTORES: Ribeiro, JTS ; Weijters, AJMM;
PUBLICAÇÃO: 2011, FONTE: 10th Confederated International Conferences on On the Move to Meaningful Internet Systems, OTM 2011: CoopIS, DOA-SVI, and ODBASE 2011 in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), VOLUME: 7044 LNCS, NÚMERO: PART 1
AUTORES: Ribeiro, JTS ; Weijters, AJMM;
PUBLICAÇÃO: 2011, FONTE: 10th Confederated International Conferences on On the Move to Meaningful Internet Systems, OTM 2011: CoopIS, DOA-SVI, and ODBASE 2011 in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), VOLUME: 7044 LNCS, NÚMERO: PART 1
2
TÃTULO: Flexible heuristics miner (FHM)
AUTORES: Weijters, AJMM; Ribeiro, JTS ;
PUBLICAÇÃO: 2011, FONTE: Symposium Series on Computational Intelligence, IEEE SSCI2011 - 2011 IEEE Symposium on Computational Intelligence and Data Mining, CIDM 2011 in IEEE SSCI 2011: Symposium Series on Computational Intelligence - CIDM 2011: 2011 IEEE Symposium on Computational Intelligence and Data Mining
AUTORES: Weijters, AJMM; Ribeiro, JTS ;
PUBLICAÇÃO: 2011, FONTE: Symposium Series on Computational Intelligence, IEEE SSCI2011 - 2011 IEEE Symposium on Computational Intelligence and Data Mining, CIDM 2011 in IEEE SSCI 2011: Symposium Series on Computational Intelligence - CIDM 2011: 2011 IEEE Symposium on Computational Intelligence and Data Mining
3
TÃTULO: Soft reliability: An interdisciplinary approach with a user-system focus Full Text
AUTORES: Koca, A; Funk, M; Karapanos, E; Rozinat, A; Van Der Aalst, WMP; Corporaal, H; Martens, JBOS; Van Der Putten, PHA; Weijters, AJMM; Brombacher, AC;
PUBLICAÇÃO: 2009, FONTE: Quality and Reliability Engineering International, VOLUME: 25, NÚMERO: 1
AUTORES: Koca, A; Funk, M; Karapanos, E; Rozinat, A; Van Der Aalst, WMP; Corporaal, H; Martens, JBOS; Van Der Putten, PHA; Weijters, AJMM; Brombacher, AC;
PUBLICAÇÃO: 2009, FONTE: Quality and Reliability Engineering International, VOLUME: 25, NÚMERO: 1
