M. Rodriguez-Irago
AuthID: R-00F-VMX
1
TITLE: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
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