Francisco Andre Correa Alegria
AuthID: R-000-59K
51
TÃTULO: Uncertainty of estimates obtained with the histogram test of ADCS
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
INDEXADO EM: 
Scopus
Scopus NO MEU: 
ORCID
ORCID52
TÃTULO: Signal Discrimination in Superheated Droplet Detectors
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
53
TÃTULO: Signal discrimination in superheated droplet detectors
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID54
TÃTULO: Precision of ADC gain and offset error estimation with the standard histogram test
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID55
TÃTULO: Measuring channel switching error in data acquisition systems
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID56
TÃTULO: Uncertainty in the ADC transition voltages determined with the histogram method
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID