Francisco Andre Correa Alegria
AuthID: R-000-59K
51
TÃTULO: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTORES: Shariat Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTORES: Shariat Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXADO EM: 
Scopus 
WOS
Scopus WOS NO MEU: 
ORCID
ORCID52
TÃTULO: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTORES: Shariat-Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 2008 IEEE Instrumentation and Measurement Technology Conference
AUTORES: Shariat-Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 2008 IEEE Instrumentation and Measurement Technology Conference
53
TÃTULO: Uncertainty analysis of the adc histogram test using triangular stimulus signals
AUTORES: Correa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2007, FONTE: 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing in Proceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing
AUTORES: Correa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2007, FONTE: 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing in Proceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID54
TÃTULO: Characterization of a high resolution acquisition system for marine geophysical applications Full Text
AUTORES: Panahi, SS; Alegria, F; Manuel, A;
PUBLICAÇÃO: 2006, FONTE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
AUTORES: Panahi, SS; Alegria, F; Manuel, A;
PUBLICAÇÃO: 2006, FONTE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
55
TÃTULO: Uncertainty of estimates obtained with the histogram test of ADCS
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID56
TÃTULO: Signal Discrimination in Superheated Droplet Detectors
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
57
TÃTULO: Signal discrimination in superheated droplet detectors
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID58
TÃTULO: Precision of ADC gain and offset error estimation with the standard histogram test
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID59
TÃTULO: Measuring channel switching error in data acquisition systems
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID60
TÃTULO: Uncertainty in the ADC transition voltages determined with the histogram method
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Corrêa Alegria, F; Cruz Serra, A;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID