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TÍTULO: A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
AUTORES: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLICAÇÃO: 2015, FONTE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
INDEXADO EM: WOS