John Carulli Carulli Jr.
AuthID: R-00H-4F9
1
TÃTULO: A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits
AUTORES: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLICAÇÃO: 2015, FONTE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
AUTORES: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLICAÇÃO: 2015, FONTE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
INDEXADO EM: 
Scopus 
DBLP
Scopus DBLP2
TÃTULO: A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
AUTORES: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLICAÇÃO: 2015, FONTE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
AUTORES: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLICAÇÃO: 2015, FONTE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
INDEXADO EM: 
WOS
WOS3
TÃTULO: Bayesian Model Fusion: Enabling Test Cost Reduction of Analog/RF Circuits via Wafer-level Spatial Variation Modeling Full Text
AUTORES: Zhang, SH; Li, X; Blanton, RD; da Silva, JM ; Carulli, JM; Butler, KM;
PUBLICAÇÃO: 2014, FONTE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
AUTORES: Zhang, SH; Li, X; Blanton, RD; da Silva, JM ; Carulli, JM; Butler, KM;
PUBLICAÇÃO: 2014, FONTE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
