Advancing Rf Gan Hemts: A Perspective on Measurement and Characterization Techniques

AuthID
P-018-DWK
Tipo de Documento
Article
Year published
2025
Publicado
in IEEE MICROWAVE MAGAZINE, ISSN: 1527-3342
Volume: 26, Número: 4, Páginas: 18-31 (14)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-105004072628
Wos: WOS:001440749600013
Source Identifiers
ISSN: 1527-3342
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