Xps Analysis and Characterization of Thin Films Cu2Znsns4 Grown Using a Novel Solution Based Route

AuthID
 P-018-N10
4
Author(s)
Calderón C.
·
Gordillo G.
·
Becerra R.
·
Tipo de Documento
Article
Year published
2015
Publicado
in Materials Science in Semiconductor Processing, ISSN: 1369-8001
Volume: 39, Páginas: 492-498 (6)
Indexing
Scopus®
Crossref®45
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84931260541
Source Identifiers
ISSN: 1369-8001
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