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The Effect of Water Related Traps on the Reliability of Organic Based Transistors
AuthID
P-004-K6V
5
Author(s)
Gomes, HL
·
Stallinga, P
·
Colle, M
·
Biscarini, F
·
de Leeuw, DM
Document Type
Article
Year published
2006
Published
in
JOURNAL OF NON-CRYSTALLINE SOLIDS,
ISSN: 0022-3093
Volume: 352, Issue: 9-20, Pages: 1761-1764 (4)
Conference
21St International Conference on Amorphous and Nanocrystalline Semiconductors,
Date:
SEP 04-09, 2005,
Location:
Lisbon, PORTUGAL
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Metadata
Sources
Publication Identifiers
DOI
:
10.1016/j.jnoncrysol.2005.10.069
Scopus
: 2-s2.0-33744548872
Wos
: WOS:000238782900215
Source Identifiers
ISSN
: 0022-3093
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