Publicações

Dft and Probabilistic Testability Analysis at Rtl

AuthID
P-004-PSX

Author(s)

Fernandes, JM

Santos, MB

Oliveira, AL

Teixeira, JC

Document Type

Proceedings Paper

Year published

2006

Published

in HLDVT'06: ELEVENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS in IEEE International High Level Design Validation and Test Workshop, ISSN: 1552-6674

Pages: 41-47 (7)

Conference

11Th Annual Ieee International Workshop on High Level Design Validation and Test, Date: NOV 08-10, 2006, Location: Monterey, CA, Sponsors: IEEE Comp Soc, TTTC, IEEE Comp Soc, DATC

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