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Probabilistic Testability Analysis and Dft Methods at Rtl
AuthID
P-004-QJK
4
Author(s)
Fernandes, JM
·
Santos, MB
·
Oliveira, AL
·
Teixeira, JC
8
Editor(s)
Matteo Sonza Reorda; Ondrej Novák; Bernd Straube; Hana Kubatova; Zdenek Kotásek; Pavel Kubalík; Raimund Ubar; Jiri Bucek
Document Type
Proceedings Paper
Year published
2006
Published
in
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
in
DDECS
Pages: 216-217 (2)
Conference
9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems,
Date:
APR 18-21, 2006,
Location:
Prague, CZECH REPUBLIC,
Sponsors:
IEEE Comp Soc, TTTC, Czech Tech Univ
Indexing
Wos
®
Dblp
®
/pt/publications/view/155219
Crossref
®
1
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/ddecs.2006.1649614
Dblp
: conf/ddecs/FernandesSOT06
Wos
: WOS:000238973400056
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