Probabilistic Testability Analysis and Dft Methods at Rtl

AuthID
 P-004-QJK
4
Author(s)
Fernandes, JM
·
Santos, MB
·
Teixeira, JC
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, ISSN: 2334-3133
Volume: 2006, Páginas: 216-+ (2)
Conference
9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2006, Location: Prague, CZECH REPUBLIC, Patrocinadores: IEEE Comp Soc, TTTC, Czech Tech Univ
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Dblp®/pt/publications/view/155219
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Publication Identifiers
DBLP: conf/ddecs/FernandesSOT06
SCOPUS: 2-s2.0-33847148458
Wos: WOS:000238973400056
Source Identifiers
ISSN: 2334-3133
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