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Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage
AuthID
P-004-QJM
6
Author(s)
Guerreiro, F
·
Semiao, J
·
Pierce, A
·
Santos, MB
·
Teixeira, IM
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2006
Published
in
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Volume: 2006, Pages: 279-284 (6)
Conference
9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems,
Date:
APR 18-21, 2006,
Location:
Prague, CZECH REPUBLIC,
Sponsors:
IEEE Comp Soc, TTTC, Czech Tech Univ
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Publication Identifiers
DOI
:
10.1109/ddecs.2006.1649635
Scopus
: 2-s2.0-33847120256
Wos
: WOS:000238973400077
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