Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

AuthID
P-004-QJM
6
Author(s)
Guerreiro, F
·
Pierce, A
·
Document Type
Proceedings Paper
Year published
2006
Published
in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Volume: 2006, Pages: 279-284 (6)
Conference
9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2006, Location: Prague, CZECH REPUBLIC, Sponsors: IEEE Comp Soc, TTTC, Czech Tech Univ
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Publication Identifiers
Scopus: 2-s2.0-33847120256
Wos: WOS:000238973400077
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