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Rtl Test Pattern Generation for High Quality Loosely Deterministic Bist
AuthID
P-000-JG7
4
Author(s)
Santos, MB
·
Fernandes, JM
·
Teixeira, IC
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2003
Published
in
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS,
ISSN: 1530-1591
Pages: 994-999 (6)
Conference
Design, Automation and Test in Europe Conference and Exhibition (Date 03),
Date:
MAR 03-07, 2003,
Location:
MUNICH, GERMANY,
Sponsors:
EDAA, EDA Consortium, IEEE Comp Soc, TTTC, IEEE Comp Soc, DATC, ECSI, ACM/SIGDA, RAS
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/date.2003.1253734
Scopus
: 2-s2.0-3042641122
Wos
: WOS:000182683800157
Source Identifiers
ISSN
: 1530-1591
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