Rtl Test Pattern Generation for High Quality Loosely Deterministic Bist

AuthID
 P-000-JG7
4
Author(s)
Teixeira, IC
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2003
Published
in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, ISSN: 1530-1591
Pages: 994-999 (6)
Conference
Design, Automation and Test in Europe Conference and Exhibition (Date 03), Date: MAR 03-07, 2003, Location: MUNICH, GERMANY, Sponsors: EDAA, EDA Consortium, IEEE Comp Soc, TTTC, IEEE Comp Soc, DATC, ECSI, ACM/SIGDA, RAS
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Publication Identifiers
SCOPUS: 2-s2.0-3042641122
Wos: WOS:000182683800157
Source Identifiers
ISSN: 1530-1591
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