The Critical Feature Dimension and Critical Sampling Problems

AuthID
 P-00G-F9G
4
Author(s)
Sung, AH
·
Suryakumar, D
·
Basnet, RB
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in ICPRAM (1)
Volume: 1, Páginas: 360-366 (6)
Indexing
Scopus®
Dblp®/pt/publications/view/539952
Google Scholar®
Publication Identifiers
DBLP: conf/icpram/RibeiroSSB15
SCOPUS: 2-s2.0-84938851785
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