in INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS: DESIGNING, TESTING, AND DIAGNOSTICS - JOIN THEM
Páginas: 323-331 (9)
Conference
International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them, Date: OCT 17-21, 1993, Location: BALTIMORE, MD, Patrocinadores: IEEE, COMP SOC, TEST TECHNOL TECH COMM, IEEE, PHILADELPHIA SECT
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
CORE Conference
No information about CORE Rank
During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings'
are automatically processed to identify their CORE Rank.
TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager
to have the correct ranking manually added to the record.
Journal Factors
Oops! It looks like you don't have access to this content.
This section is restricted to uses with b-on access.
Info
At this moment we don't have any links to full text documens.
