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Trapping Behavior of Gan Hemts and Its Implications on Class B Pa Bias Point Selection
AuthID
P-00M-BNB
4
Author(s)
Cabral, PM
·
Nunes, LC
·
Ressurreicao, T
·
Pedro, JC
Document Type
Article
Year published
2017
Published
in
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS,
ISSN: 0894-3370
Volume: 30, Issue: 1, Pages: e2128 (11)
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Publication Identifiers
DOI
:
10.1002/jnm.2128
Scopus
: 2-s2.0-85012850368
Wos
: WOS:000390786800006
Source Identifiers
ISSN
: 0894-3370
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