Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-Vdd Test

AuthID
 P-000-6YE
6
Author(s)
Rodriguez Irago, M
·
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in 11th IEEE International On-Line Testing Symposium
Volume: 2005, Páginas: 281-286 (6)
Conference
11Th Ieee International On-Line Testing Symposium, Date: JUL 06-08, 2005, Location: St Raphael, FRANCE, Patrocinadores: IEEE Comp Soc, Test Technol Tech Council
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Publication Identifiers
SCOPUS: 2-s2.0-33745490052
Wos: WOS:000231055600054
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