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11Th Ieee International On-Line Testing Symposium, Date: JUL 06-08, 2005, Location: St Raphael, FRANCE, Sponsors: IEEE Comp Soc, Test Technol Tech Council

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DOI: 10.1109/iolts.2005.25

Scopus: 2-s2.0-33745490052

Wos: WOS:000231055600054

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Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-Vdd Test

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Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-Vdd Test

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