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Low-Frequency Noise as a Diagnostic Tool for Oled Reliability
AuthID
P-00P-8FT
6
Author(s)
Rocha, PRF
·
Gomes, HL
·
Vandamme, LKJ
·
De Leeuw, DM
·
Meskers, SCJ
·
van de Weijer, P
Document Type
Proceedings Paper
Year published
2013
Published
in
2013 22ND INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF)
Conference
22Nd International Conference on Noise and Fluctuations (Icnf),
Date:
JUN 24-28, 2013,
Location:
Montpellier, FRANCE
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: WOS:000332005700074
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