Single Trial Detection of Error-Related Potentials in Brain-Machine Interfaces: a Survey and Comparison of Methods

AuthID
 P-00X-TJB
4
Author(s)
Yasemin, M
·
Document Type
Article
Year published
2023
Published
in JOURNAL OF NEURAL ENGINEERING, ISSN: 1741-2560
Volume: 20, Issue: 1
Indexing
Wos®
Scopus®
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 36595316
Scopus: 2-s2.0-85146484470
Wos: WOS:000916474600001
Source Identifiers
ISSN: 1741-2560
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service