Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

AuthID
 P-002-WZ8
7
Author(s)
Martins, CV
·
Vazquez, JC
·
Document Type
Proceedings Paper
Year published
2011
Published
in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS) in IEEE VLSI Test Symposium, ISSN: 1093-0167
Pages: 203-208 (6)
Conference
29Th Ieee Vlsi Test Symposium (Vts)/Workshop on Design for Reliability and Variability (Drv), Date: MAY 01-05, 2011, Location: Dana Point, CA, Sponsors: IEEE, IEEE Comp Soc, IEEE Comp Soc Test Technol Tech Council
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Publication Identifiers
Scopus: 2-s2.0-79959649877
Wos: WOS:000300521100038
Source Identifiers
ISSN: 1093-0167
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