Surface Roughness and Fractal Analysis of Tio2 Thin Films by Dc Sputtering †

AuthID
 P-01A-QMS
3
Author(s)
Eleutério, T
·
Meirelles, MG
Document Type
Article
Year published
2025
Published
in Engineering Proceedings
Volume: 105, Issue: 1, Pages: 2
Indexing
Scopus®
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Publication Identifiers
Scopus: 2-s2.0-105025719181
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