Surface Roughness and Fractal Analysis of Tio2 Thin Films by Dc Sputtering †

AuthID
P-01A-QMS
3
Author(s)
Eleutério, T
·
Meirelles, MG
Tipo de Documento
Article
Year published
2025
Publicado
in Engineering Proceedings
Volume: 105, Número: 1, Páginas: 2
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-105025719181
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