ProfileOfResearchers

TITLE: Performance failure prediction using built-in delay sensors in FPGAs
AUTHORS: Bexiga, V; Leong, C; Jorge Semião ; Ic Teixeira ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2011, SOURCE: 21st International Conference on Field Programmable Logic and Applications, FPL 2011 in Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011

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TITLE: Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects
AUTHORS: Valdes, M; Freijedo, J; Moure, MJ; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop

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TITLE: Delay modeling for power noise-aware design in Spartan-3A FPGAS
AUTHORS: Freijedo, JF; Valdes, MD; Moure, MJ; Costas, L; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 6th Southern Programmable Logic Conference, SPL 2010 in 6th Southern Programmable Logic Conference, SPL 2010 - Proceedings

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TITLE: Impact of power supply voltage variations on FPGA-based digital systems performance
AUTHORS: Freijedo, J; Costas, L; Jorge Semião ; Rodriguez Andina, JJ; Moure, MJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: Journal of Low Power Electronics, VOLUME: 6, ISSUE: 2

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TITLE: Investigating the use of BICS to detect resistive- open defects in SRAMs
AUTHORS: Chipana, R; Bolzani, L; Vargas, F; Jorge Semião ; Rodriguez Andina, J; Teixeira, I ; Teixeira, P;
PUBLISHED: 2010, SOURCE: 16th IEEE International On-Line Testing Symposium, IOLTS 2010 in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010

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TITLE: Predictive error detection by on-line aging monitoring
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 16th IEEE International On-Line Testing Symposium, IOLTS 2010 in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010

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