Jorge Filipe Leal Costa Semião


AuthID: R-001-F67

Confirmed Publications: 81



71
TITLE: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
72
TITLE: Improving tolerance to power-supply and temperature variations in synchronous circuits
AUTHORS: Jorge Semião ; Freijedo, J; Rodiriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 10th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID | CIÊNCIAVITAE
73
TITLE: On-line dynamic delay insertion to improve signal integrity in synchronous circuits
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2007, SOURCE: 13th IEEE International On-Line Testing Symposium in 13TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID | CIÊNCIAVITAE
74
TITLE: Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes
AUTHORS: Rodriguez Irago, M; Andina, JJR; Vargas, F; Jorge Semião ; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: IOLTS 2006: 12th IEEE International On-Line Testing Symposium in Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium, VOLUME: 2006
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
75
TITLE: Functional-oriented BIST of sequential circuits aiming at dynamic faults coverage
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
INDEXED IN: Scopus WOS
76
TITLE: Functional-oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; M.B Santos; I.M Teixeira;
PUBLISHED: 2006, SOURCE: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems
INDEXED IN: CrossRef
IN MY: ORCID | CIÊNCIAVITAE
77
TITLE: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXED IN: WOS
IN MY: ORCID | ResearcherID | CIÊNCIAVITAE
78
TITLE: Quality of electronic design: from architectural level to test coverage
AUTHORS: O.P Dias; M.B Santos; J.P Teixeira; Jorge Semião ; I.M Teixeira;
PUBLISHED: 2002, SOURCE: Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
INDEXED IN: CrossRef: 3
IN MY: ORCID | CIÊNCIAVITAE
79
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
80
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
Page 8 of 9. Total results: 81.

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