11
TITLE: From Boolean algebra to processor architecture and assembly programming in one semester
AUTHORS: Matos, JS ; Alves, JC ; Mendonca, HS ; Araujo, AJ;
PUBLISHED: 2014, SOURCE: 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014 in Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014
INDEXED IN: Scopus CrossRef: 1
IN MY: ORCID
13
TITLE: Global localisation algorithm from a multiple hypotheses set
AUTHORS: Pinto, M; Sobreira, H ; Moreira, AP ; Mendonca, H ;
PUBLISHED: 2012, SOURCE: 2012 1st Brazilian Robotics Symposium, SBR 2012 and 9th Latin American Robotics Symposium, LARS 2012 in Proceedings - 2012 Brazilian Robotics Symposium and Latin American Robotics Symposium, SBR-LARS 2012
INDEXED IN: Scopus CrossRef
IN MY: ORCID
14
TITLE: Estimation of analogue-to-digital converter's signal-to-noise plus distortion ratio using the code histogram method  Full Text
AUTHORS: Mendonca, HS ; Machado M da Silva ; Matos, JS ;
PUBLISHED: 2008, SOURCE: IET SCIENCE MEASUREMENT & TECHNOLOGY, VOLUME: 2, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
15
TITLE: ADC Applications, Architectures and Terminology
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef: 1
IN MY: ORCID
16
TITLE: Comparative Study of ADC Sinewave Test Methods
AUTHORS: José Machado Silva ; Hélio Mendonça ; Sara Mazoleni;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
17
TITLE: Differential Gain and Phase Testing
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
18
TITLE: Computing ADC harmonic content from a reduced number of values  Full Text
AUTHORS: Mendonca, HS ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
19
TITLE: ADC testing using joint time-frequency analysis  Full Text
AUTHORS: Mendonca, H ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2001, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 23, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
20
TITLE: Differential gain and phase testing using joint time-frequency analysis
AUTHORS: Mendonca, HS ; Silva, JM ; Matos, JS;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
Page 2 of 3. Total results: 21.