Marcelino Bicho dos Santos
AuthID: R-000-A9P
21
TITLE: Control strategies for a wave energy converter connected to a hydraulic power take-off
AUTHORS: Ricci, P; Lopez, J; Santos, M; Ruiz Minguela, P; Villate, JL; Salcedo, F; deO. F D Falcao;
PUBLISHED: 2011, SOURCE: IET RENEWABLE POWER GENERATION, VOLUME: 5, ISSUE: 3
AUTHORS: Ricci, P; Lopez, J; Santos, M; Ruiz Minguela, P; Villate, JL; Salcedo, F; deO. F D Falcao;
PUBLISHED: 2011, SOURCE: IET RENEWABLE POWER GENERATION, VOLUME: 5, ISSUE: 3
22
TITLE: Spectral selectivity constraints in fluorescence detection of biomolecules using amorphous silicon based detectors Full Text
AUTHORS: Conde, JP ; Joskowiak, A; Lipovsek, B; Pimentel, A; Pereira, AT; Santos, M; Krc, J; Topic, M; Prazeres, DMF ; Chu, V ;
PUBLISHED: 2010, SOURCE: 23rd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS23) in PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4, VOLUME: 7, ISSUE: 3-4
AUTHORS: Conde, JP ; Joskowiak, A; Lipovsek, B; Pimentel, A; Pereira, AT; Santos, M; Krc, J; Topic, M; Prazeres, DMF ; Chu, V ;
PUBLISHED: 2010, SOURCE: 23rd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS23) in PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4, VOLUME: 7, ISSUE: 3-4
23
TITLE: Real time control of plasmas and ECRH systems on TCV Full Text
AUTHORS: Paley, JI; Berrino, J; Coda, S; Cruz, N; Duval, BP; Felici, F; Goodman, TP; Martin, Y; Moret, JM; Piras, F; Rodriques, AP; Santos, B; Varandas, CAF ;
PUBLISHED: 2009, SOURCE: NUCLEAR FUSION, VOLUME: 49, ISSUE: 8
AUTHORS: Paley, JI; Berrino, J; Coda, S; Cruz, N; Duval, BP; Felici, F; Goodman, TP; Martin, Y; Moret, JM; Piras, F; Rodriques, AP; Santos, B; Varandas, CAF ;
PUBLISHED: 2009, SOURCE: NUCLEAR FUSION, VOLUME: 49, ISSUE: 8
24
TITLE: <title>A 100mA fractional step-down charge pump with digital control</title>
AUTHORS: Valter A L Sadio; Abílio E M Parreira; Marcelino B Santos;
PUBLISHED: 2009, SOURCE: VLSI Circuits and Systems IV
AUTHORS: Valter A L Sadio; Abílio E M Parreira; Marcelino B Santos;
PUBLISHED: 2009, SOURCE: VLSI Circuits and Systems IV
25
TITLE: Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores
AUTHORS: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLISHED: 2009, SOURCE: Journal of Low Power Electronics, VOLUME: 5, ISSUE: 2
AUTHORS: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLISHED: 2009, SOURCE: Journal of Low Power Electronics, VOLUME: 5, ISSUE: 2
26
TITLE: The CMS experiment at the CERN LHC
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
27
TITLE: The CMS experiment at the CERN LHC
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
28
TITLE: Probabilistic testability analysis and DFT methods at RTL
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
AUTHORS: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
IN MY: ResearcherID
29
TITLE: Functional-oriented BIST of sequential circuits aiming at dynamic faults coverage
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLISHED: 2006, SOURCE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
INDEXED IN: Scopus WOS
IN MY: ResearcherID
30
TITLE: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXED IN: WOS
IN MY: ResearcherID