Sérgio Nuno Canteiro de Magalhães
AuthID: R-001-JX8
11
TITLE: Validation of a low-cost selective powder deposition process through the characterization of tin bronze specimens
AUTHORS: Magalhaes, S; Sardinha, M; Vicente, C; Leite, M; Ribeiro, R; Vaz, M; Reis, L;
PUBLISHED: 2021, SOURCE: PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART L-JOURNAL OF MATERIALS-DESIGN AND APPLICATIONS
AUTHORS: Magalhaes, S; Sardinha, M; Vicente, C; Leite, M; Ribeiro, R; Vaz, M; Reis, L;
PUBLISHED: 2021, SOURCE: PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART L-JOURNAL OF MATERIALS-DESIGN AND APPLICATIONS
INDEXED IN: 
WOS
WOS12
TITLE: Mindful Acceptance Predicts Writing Achievement in 6th-Graders Full Text
AUTHORS: Cordeiro, C; Magalhaes, S; Nunes, A; Olive, T; Castro, SL ; Limpo, T;
PUBLISHED: 2021, SOURCE: JOURNAL OF RESEARCH IN CHILDHOOD EDUCATION
AUTHORS: Cordeiro, C; Magalhaes, S; Nunes, A; Olive, T; Castro, SL ; Limpo, T;
PUBLISHED: 2021, SOURCE: JOURNAL OF RESEARCH IN CHILDHOOD EDUCATION
13
TITLE: Estimating the uncertainties of strain and damage analysis by X-ray diffraction in ion implanted MoO3 Full Text
AUTHORS: Pereira, DR; Magalhaes, S; Diaz Guerra, C; Peres, M; Correia, JG; Marques, JG; Silva, AG ; Alves, E; Cardoso, S; Freitas, PP; Lorenz, K;
PUBLISHED: 2020, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 478
AUTHORS: Pereira, DR; Magalhaes, S; Diaz Guerra, C; Peres, M; Correia, JG; Marques, JG; Silva, AG ; Alves, E; Cardoso, S; Freitas, PP; Lorenz, K;
PUBLISHED: 2020, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 478
14
TITLE: Engineering strain and conductivity of MoO3 by ion implantation (vol 169, pg 15, 2019) Full Text
AUTHORS: Daniela R Pereira; Carlos Diaz Guerra; Marco Peres; Sergio Magalhaes; Joao G Correia; Jose G Marques; Ana G Silva; Eduardo Alves; Katharina Lorenz;
PUBLISHED: 2020, SOURCE: ACTA MATERIALIA, VOLUME: 199
AUTHORS: Daniela R Pereira; Carlos Diaz Guerra; Marco Peres; Sergio Magalhaes; Joao G Correia; Jose G Marques; Ana G Silva; Eduardo Alves; Katharina Lorenz;
PUBLISHED: 2020, SOURCE: ACTA MATERIALIA, VOLUME: 199
INDEXED IN: WOS
WOS15
TITLE: RBS/C, XRR, and XRD Studies of Damage Buildup in Er-Implanted ZnO Full Text
AUTHORS: Przemyslaw Jozwik; Sergio Magalhaes; Renata Ratajczak; Cyprian Mieszczynski; Miguel Sequeira; Andrzej Turos; Roman Boettger; Rene Heller; Katharina Lorenz; Eduardo Alves;
PUBLISHED: 2019, SOURCE: Symposium K on Defect-Induced Effects in Nanomaterials at the Meeting of the European-Materials-Research-Society in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 256, ISSUE: 5
AUTHORS: Przemyslaw Jozwik; Sergio Magalhaes; Renata Ratajczak; Cyprian Mieszczynski; Miguel Sequeira; Andrzej Turos; Roman Boettger; Rene Heller; Katharina Lorenz; Eduardo Alves;
PUBLISHED: 2019, SOURCE: Symposium K on Defect-Induced Effects in Nanomaterials at the Meeting of the European-Materials-Research-Society in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 256, ISSUE: 5
INDEXED IN: 
Scopus WOS
Scopus WOS16
TITLE: Luminescence properties of MOCVD grown Al0.2Ga0.8N layers implanted with Tb
AUTHORS: Rodrigues, J; Fialho, M; Magalhaes, S; Lorenz, K; Alves, E; Monteiro, T;
PUBLISHED: 2019, SOURCE: JOURNAL OF LUMINESCENCE, VOLUME: 210
AUTHORS: Rodrigues, J; Fialho, M; Magalhaes, S; Lorenz, K; Alves, E; Monteiro, T;
PUBLISHED: 2019, SOURCE: JOURNAL OF LUMINESCENCE, VOLUME: 210
INDEXED IN: Scopus WOS
Scopus WOS17
TITLE: Measuring strain caused by ion implantation in GaN Full Text
AUTHORS: Mendes, P; Lorenz, K; Alves, E; Schwaiger, S; Scholz, F; Magalhaes, S;
PUBLISHED: 2019, SOURCE: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 98
AUTHORS: Mendes, P; Lorenz, K; Alves, E; Schwaiger, S; Scholz, F; Magalhaes, S;
PUBLISHED: 2019, SOURCE: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 98
INDEXED IN: Scopus WOS
Scopus WOS18
TITLE: Optical investigations of europium ion implanted in nitride-based diode structures Full Text
AUTHORS: Ben Sedrine, N; Rodrigues, J; Cardoso, J; Nd. Faye, DN; Fialho, M; Magalhaes, S; Martins, AF; Neves, AJ; Alves, E; Bockowski, M; Hoffmann, V; Weyers, M; Lorenz, K; Correia, MR; Monteiro, T;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
AUTHORS: Ben Sedrine, N; Rodrigues, J; Cardoso, J; Nd. Faye, DN; Fialho, M; Magalhaes, S; Martins, AF; Neves, AJ; Alves, E; Bockowski, M; Hoffmann, V; Weyers, M; Lorenz, K; Correia, MR; Monteiro, T;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
INDEXED IN: Scopus WOS
Scopus WOS19
TITLE: Defect formation and optical activation of Tb implanted AlxGa1-xN films using channeled implantation at different temperatures Full Text
AUTHORS: Fialho, M; Magalhaes, S; Rodrigues, J; Chauvat, MP; Ruterana, P; Monteiro, T; Lorenz, K; Alves, E;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
AUTHORS: Fialho, M; Magalhaes, S; Rodrigues, J; Chauvat, MP; Ruterana, P; Monteiro, T; Lorenz, K; Alves, E;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
INDEXED IN: WOS
WOS20
TITLE: Crystal damage analysis of implanted AlxGa1-xN (0 <= x <= 1) by ion beam techniques Full Text
AUTHORS: Nd. N Faye; Dobeli, M; Wendler, E; Brunner, F; Weyers, M; Magalhaes, S; Alves, E; Lorenz, K;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
AUTHORS: Nd. N Faye; Dobeli, M; Wendler, E; Brunner, F; Weyers, M; Magalhaes, S; Alves, E; Lorenz, K;
PUBLISHED: 2018, SOURCE: International Conference on Surface Modification of Materials by Ion Beams (SMMIB) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 355
INDEXED IN: WOS
WOS