José Augusto de Almeida Pinheiro de Carvalho
AuthID: R-000-843
1
TITLE: Risk factors for sporadic listeriosis: A systematic review and meta-analysis
AUTHORS: Leclercq, A; Kooh, P; Augustin, JC; Guillier, L; Thebault, A; Cadavez, V; Gonzales Barron, U; Sanaa, M;
PUBLISHED: 2021, SOURCE: MICROBIAL RISK ANALYSIS, VOLUME: 17
AUTHORS: Leclercq, A; Kooh, P; Augustin, JC; Guillier, L; Thebault, A; Cadavez, V; Gonzales Barron, U; Sanaa, M;
PUBLISHED: 2021, SOURCE: MICROBIAL RISK ANALYSIS, VOLUME: 17
2
TITLE: Data Acquisition, Conditioning and Processing System for a Wearable-based Biostimulation
AUTHORS: Sestrem, Leonardo; Kaizer, Raul; Goncalves, Joao; Leitao, Paulo; Teixeira, Joao Paulo; Lima, Jose; Franco, Tiago; Carvalho, Jose Augusto;
PUBLISHED: 2021, SOURCE: 15th International Joint Conference on Biomedical Engineering Systems and Technologies (BIOSTEC) / 15th International Conference on Biomedical Electronics and Devices (BIODEVICES) in PROCEEDINGS OF THE 15TH INTERNATIONAL JOINT CONFERENCE ON BIOMEDICAL ENGINEERING SYSTEMS AND TECHNOLOGIES (BIODEVICES), VOL 1
AUTHORS: Sestrem, Leonardo; Kaizer, Raul; Goncalves, Joao; Leitao, Paulo; Teixeira, Joao Paulo; Lima, Jose; Franco, Tiago; Carvalho, Jose Augusto;
PUBLISHED: 2021, SOURCE: 15th International Joint Conference on Biomedical Engineering Systems and Technologies (BIOSTEC) / 15th International Conference on Biomedical Electronics and Devices (BIODEVICES) in PROCEEDINGS OF THE 15TH INTERNATIONAL JOINT CONFERENCE ON BIOMEDICAL ENGINEERING SYSTEMS AND TECHNOLOGIES (BIODEVICES), VOL 1
INDEXED IN: 
WOS
WOS3
TITLE: Modular Data Acquisition Architecture for Thin-Film Sensors Surfaces
AUTHORS: Rodrigues, N; Lima, J ; Rodrigues, PJ; Carvalho, JA; Laranjeira, J; Maidana, W; Leitao, P;
PUBLISHED: 2020, SOURCE: IEEE 29th International Symposium on Industrial Electronics (ISIE) in 2020 IEEE 29TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), VOLUME: 2020-June
AUTHORS: Rodrigues, N; Lima, J ; Rodrigues, PJ; Carvalho, JA; Laranjeira, J; Maidana, W; Leitao, P;
PUBLISHED: 2020, SOURCE: IEEE 29th International Symposium on Industrial Electronics (ISIE) in 2020 IEEE 29TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), VOLUME: 2020-June
4
TITLE: Assessment of PROFIBUS networks using a fault injection framework
AUTHORS: Jose Augusto Carvalho; Adriano S Silva Carvalho ; Paulo Jose Portugal ;
PUBLISHED: 2005, SOURCE: 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) in ETFA 2005: 10TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 1, PTS 1 AND 2, PROCEEDINGS, VOLUME: 1 2 VOLS
AUTHORS: Jose Augusto Carvalho; Adriano S Silva Carvalho ; Paulo Jose Portugal ;
PUBLISHED: 2005, SOURCE: 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) in ETFA 2005: 10TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 1, PTS 1 AND 2, PROCEEDINGS, VOLUME: 1 2 VOLS
5
TITLE: Experimental analysis of outage times for PROFIBUS networks
AUTHORS: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLISHED: 2005, SOURCE: 31st Annual Conference of the IEEE-Industrial-Electronics-Society in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3, VOLUME: 2005
AUTHORS: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLISHED: 2005, SOURCE: 31st Annual Conference of the IEEE-Industrial-Electronics-Society in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3, VOLUME: 2005
6
TITLE: A framework for dependability evaluation of PROFIBUS networks
AUTHORS: Carvalho, J; Portugal, P ; Carvalho, A ;
PUBLISHED: 2003, SOURCE: IEEE International Symposium on Industrial Electronics in 2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
AUTHORS: Carvalho, J; Portugal, P ; Carvalho, A ;
PUBLISHED: 2003, SOURCE: IEEE International Symposium on Industrial Electronics in 2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
INDEXED IN: WOS
WOS7
TITLE: Dependability validation techniques for electronic systems
AUTHORS: Portugal, P ; Carvalho, J; Carvalho, A ;
PUBLISHED: 2002, SOURCE: 6th European Space Power Conference (ESPC) in PROCEEDINGS OF THE SIXTH EUROPEAN SPACE POWER CONFERENCE (ESPC), VOLUME: 502, ISSUE: 502
AUTHORS: Portugal, P ; Carvalho, J; Carvalho, A ;
PUBLISHED: 2002, SOURCE: 6th European Space Power Conference (ESPC) in PROCEEDINGS OF THE SIXTH EUROPEAN SPACE POWER CONFERENCE (ESPC), VOLUME: 502, ISSUE: 502
INDEXED IN: 
Scopus WOS
Scopus WOS