José Augusto de Almeida Pinheiro de Carvalho
AuthID: R-000-843
1
TÃTULO: Risk factors for sporadic listeriosis: A systematic review and meta-analysis
AUTORES: Leclercq, A; Kooh, P; Augustin, JC; Guillier, L; Thebault, A; Cadavez, V ; Gonzales Barron, U; Sanaa, M;
PUBLICAÇÃO: 2021, FONTE: MICROBIAL RISK ANALYSIS, VOLUME: 17
AUTORES: Leclercq, A; Kooh, P; Augustin, JC; Guillier, L; Thebault, A; Cadavez, V ; Gonzales Barron, U; Sanaa, M;
PUBLICAÇÃO: 2021, FONTE: MICROBIAL RISK ANALYSIS, VOLUME: 17
2
TÃTULO: Data Acquisition, Conditioning and Processing System for a Wearable-based Biostimulation
AUTORES: Sestrem, Leonardo; Kaizer, Raul; Goncalves, Joao; Leitao, Paulo ; Teixeira, Joao Paulo ; Lima, Jose ; Franco, Tiago; Carvalho, Jose Augusto;
PUBLICAÇÃO: 2021, FONTE: 15th International Joint Conference on Biomedical Engineering Systems and Technologies (BIOSTEC) / 15th International Conference on Biomedical Electronics and Devices (BIODEVICES) in PROCEEDINGS OF THE 15TH INTERNATIONAL JOINT CONFERENCE ON BIOMEDICAL ENGINEERING SYSTEMS AND TECHNOLOGIES (BIODEVICES), VOL 1
AUTORES: Sestrem, Leonardo; Kaizer, Raul; Goncalves, Joao; Leitao, Paulo ; Teixeira, Joao Paulo ; Lima, Jose ; Franco, Tiago; Carvalho, Jose Augusto;
PUBLICAÇÃO: 2021, FONTE: 15th International Joint Conference on Biomedical Engineering Systems and Technologies (BIOSTEC) / 15th International Conference on Biomedical Electronics and Devices (BIODEVICES) in PROCEEDINGS OF THE 15TH INTERNATIONAL JOINT CONFERENCE ON BIOMEDICAL ENGINEERING SYSTEMS AND TECHNOLOGIES (BIODEVICES), VOL 1
3
TÃTULO: Modular Data Acquisition Architecture for Thin-Film Sensors Surfaces
AUTORES: Rodrigues, N; Lima, J ; Rodrigues, PJ; Carvalho, JA; Laranjeira, J; Maidana, W; Leitao, P ;
PUBLICAÇÃO: 2020, FONTE: IEEE 29th International Symposium on Industrial Electronics (ISIE) in 2020 IEEE 29TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), VOLUME: 2020-June
AUTORES: Rodrigues, N; Lima, J ; Rodrigues, PJ; Carvalho, JA; Laranjeira, J; Maidana, W; Leitao, P ;
PUBLICAÇÃO: 2020, FONTE: IEEE 29th International Symposium on Industrial Electronics (ISIE) in 2020 IEEE 29TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), VOLUME: 2020-June
4
TÃTULO: Assessment of PROFIBUS networks using a fault injection framework
AUTORES: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLICAÇÃO: 2005, FONTE: 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) in ETFA 2005: 10TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 1, PTS 1 AND 2, PROCEEDINGS, VOLUME: 1 2 VOLS
AUTORES: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLICAÇÃO: 2005, FONTE: 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) in ETFA 2005: 10TH IEEE INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 1, PTS 1 AND 2, PROCEEDINGS, VOLUME: 1 2 VOLS
5
TÃTULO: Experimental analysis of outage times for PROFIBUS networks
AUTORES: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLICAÇÃO: 2005, FONTE: 31st Annual Conference of the IEEE-Industrial-Electronics-Society in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3, VOLUME: 2005
AUTORES: Carvalho, JA; Carvalho, AS ; Portugal, PJ ;
PUBLICAÇÃO: 2005, FONTE: 31st Annual Conference of the IEEE-Industrial-Electronics-Society in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3, VOLUME: 2005
