Surface Roughness and Fractal Analysis of Tio2 Thin Films by Dc Sputtering

AuthID
 P-01A-QMS
3
Author(s)
Eleutério, T
·
Meirelles, M
Document Type
Proceedings Paper
Year published
2025
Published
in CIC 2025
Pages: 2
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service