ProfileOfResearchers

TÃTULO: Performance sensor for tolerance and predictive detection of delay-faults
AUTORES: Jorge Semião ; Saraiva, D; Leong, C; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2014, FONTE: 27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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TÃTULO: AGING MONITORING WITH LOCAL SENSORS IN FPGA-BASED DESIGNS
AUTORES: Leong, C; Jorge Semião ; Teixeira, IC; Santos, MB; Teixeira, JP; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLICAÇÃO: 2013, FONTE: 23rd International Conference on Field Programmable Logic and Applications (FPL) in 2013 23RD INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL 2013) PROCEEDINGS

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TÃTULO: Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTORES: Maria D Valdes Pena; Judit F Fernandez Freijedo; Maria J M Moure Rodriguez; Juan J Rodriguez Andina; Jorge Semião ; Isabel Maria C Cacho Teixeira ; Joao Paulo C Cacho Teixeira ; Fabian Vargas;
PUBLICAÇÃO: 2013, FONTE: IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOLUME: 12, NÚMERO: 4

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TÃTULO: Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion Full Text
AUTORES: Vazquez, JC; Champac, V; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLICAÇÃO: 2013, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 29, NÚMERO: 3

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TÃTULO: Aging-Aware Power or Frequency Tuning With Predictive Fault Detection Full Text
AUTORES: Jackson Pachito; Celestino V Martins; Bruno Jacinto; Isabel C Teixeira ; Joao Paulo Teixeira ; Jorge Semião ; Julio C Vazquez; Victor Champac; Marcelino B Santos ;
PUBLICAÇÃO: 2012, FONTE: IEEE DESIGN & TEST OF COMPUTERS, VOLUME: 29, NÚMERO: 5

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TÃTULO: Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits Full Text
AUTORES: Judit F Freijedo; Jorge Semião ; Juan J Rodriguez Andina; Fabian Vargas; Isabel C Teixeira ; Paulo Teixeira, JP ;
PUBLICAÇÃO: 2012, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 28, NÚMERO: 4

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TÃTULO: The Influence of Clock-Gating On NBTI-Induced Delay Degradation
AUTORES: Pachito, J; Martins, CV; Jorge Semião ; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2012, FONTE: IEEE 18th International On-Line Testing Symposium (IOLTS) in 2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS)

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TÃTULO: Adaptive Error-Prediction Flip-flop for Performance Failure Prediction with Aging Sensors
AUTORES: Martins, CV; Jorge Semião ; Vazquez, JC; Champac, V; Santos, M ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2011, FONTE: 29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV) in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS)

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TÃTULO: IP core to leverage RTOS-based embedded systems reliability to electromagnetic interference
AUTORES: Silva, D; Poehls, LB; Jorge Semião ; Teixeira, IC ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLICAÇÃO: 2011, FONTE: 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2011 in Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011

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