Marcelino Bicho dos Santos
AuthID: R-000-A9P
41
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: 
Scopus
Scopus42
TITLE: VHDL fault simulation for defect-oriented test and diagnosis of digital ICs
AUTHORS: Celeiro, F; Dias, L; Ferreira, J; Santos, MB; Teixeira, JP ;
PUBLISHED: 1996, SOURCE: European Design Automation Conference (EURO-DAC 96), with EURO-VHDL 96 and Exhibition in EURO-DAC '96 - EUROPEAN DESIGN AUTOMATION CONFERENCE WITH EURO-VHDL '96 AND EXHIBITION, PROCEEDINGS
AUTHORS: Celeiro, F; Dias, L; Ferreira, J; Santos, MB; Teixeira, JP ;
PUBLISHED: 1996, SOURCE: European Design Automation Conference (EURO-DAC 96), with EURO-VHDL 96 and Exhibition in EURO-DAC '96 - EUROPEAN DESIGN AUTOMATION CONFERENCE WITH EURO-VHDL '96 AND EXHIBITION, PROCEEDINGS
INDEXED IN: Scopus 
WOS
Scopus WOS IN MY: ResearcherID
ResearcherID43
TITLE: Defect-oriented IC test and diagnosis using VHDL fault simulation Full Text
AUTHORS: Celeiro, F; Dias, L; Ferreira, J; Santos, MB; Teixeira, JP ;
PUBLISHED: 1996, SOURCE: 1996 International Test Conference (ITC 1996) - Test and Design Validity in INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS
AUTHORS: Celeiro, F; Dias, L; Ferreira, J; Santos, MB; Teixeira, JP ;
PUBLISHED: 1996, SOURCE: 1996 International Test Conference (ITC 1996) - Test and Design Validity in INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS
INDEXED IN: Scopus WOS
Scopus WOS IN MY: ResearcherID
ResearcherID44
TITLE: BACK ANNOTATION OF PHYSICAL DEFECTS INTO GATE-LEVEL, REALISTIC FAULTS IN DIGITAL ICS
AUTHORS: CALHA, M; SANTOS, M; GONCALVES, F; TEIXEIRA, I; TEIXEIRA, JP;
PUBLISHED: 1994, SOURCE: International Test Conference 1994 (ITC 94) - TEST; The Next 25-Years in INTERNATIONAL TEST CONFERENCE 1994, PROCEEDINGS
AUTHORS: CALHA, M; SANTOS, M; GONCALVES, F; TEIXEIRA, I; TEIXEIRA, JP;
PUBLISHED: 1994, SOURCE: International Test Conference 1994 (ITC 94) - TEST; The Next 25-Years in INTERNATIONAL TEST CONFERENCE 1994, PROCEEDINGS
INDEXED IN: WOS
WOS IN MY: ResearcherID
ResearcherID45
TITLE: PHYSICAL DFT FOR HIGH COVERAGE OF REALISTIC FAULTS
AUTHORS: SARAIVA, M; CASIMIRO, P; SANTOS, M; SOUSA, JT; GONCALVES, F; TEIXEIRA, I; TEIXEIRA, JP;
PUBLISHED: 1992, SOURCE: 1992 INTERNATIONAL TEST CONF ON DISCOVER THE NEW WORLD OF TEST AND DESIGN in INTERNATIONAL TEST CONFERENCE 1992 : PROCEEDINGS: DISCOVER THE NEW WORLD OF TEST AND DESIGN
AUTHORS: SARAIVA, M; CASIMIRO, P; SANTOS, M; SOUSA, JT; GONCALVES, F; TEIXEIRA, I; TEIXEIRA, JP;
PUBLISHED: 1992, SOURCE: 1992 INTERNATIONAL TEST CONF ON DISCOVER THE NEW WORLD OF TEST AND DESIGN in INTERNATIONAL TEST CONFERENCE 1992 : PROCEEDINGS: DISCOVER THE NEW WORLD OF TEST AND DESIGN
INDEXED IN: WOS
WOS IN MY: ResearcherID
ResearcherID46
TITLE: LAYOUT-LEVEL TECHNIQUES FOR TESTABILITY IMPROVEMENT OF MOS PHYSICAL DESIGNS
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
INDEXED IN: WOS
WOS IN MY: ResearcherID
ResearcherID