M. Ohletz
AuthID: R-006-NHY
1
TITLE: Defect-oriented testing of analogue and mixed signal ICs
AUTHORS: Santos, MB ; Goncalves, FM ; Ohletz, M; Teixeira, JP ;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 2
AUTHORS: Santos, MB ; Goncalves, FM ; Ohletz, M; Teixeira, JP ;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 2
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