Fernando Manuel Duarte Gonçalves
AuthID: R-000-51G
21
TITLE: Radical initiated oxidative degradation of oat-spelts xylan Full Text
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 1
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 1
22
TITLE: Characterization of white wine mannoproteins Full Text
AUTHORS: Goncalves, F; Heyraud, A; De Pinho, MN ; Rinaudo, M;
PUBLISHED: 2002, SOURCE: JOURNAL OF AGRICULTURAL AND FOOD CHEMISTRY, VOLUME: 50, ISSUE: 21
AUTHORS: Goncalves, F; Heyraud, A; De Pinho, MN ; Rinaudo, M;
PUBLISHED: 2002, SOURCE: JOURNAL OF AGRICULTURAL AND FOOD CHEMISTRY, VOLUME: 50, ISSUE: 21
INDEXED IN: 
Scopus 
WOS
Scopus WOS23
TITLE: Optimisation of the method for determination of the temperature of saturation in wines Full Text
AUTHORS: dos Santos, PC; Goncalves, F; De Pinho, MN ;
PUBLISHED: 2002, SOURCE: 2nd In Vino Analytica Scientia Symposium in ANALYTICA CHIMICA ACTA, VOLUME: 458, ISSUE: 1
AUTHORS: dos Santos, PC; Goncalves, F; De Pinho, MN ;
PUBLISHED: 2002, SOURCE: 2nd In Vino Analytica Scientia Symposium in ANALYTICA CHIMICA ACTA, VOLUME: 458, ISSUE: 1
24
TITLE: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXED IN: WOS 
CrossRef
WOS CrossRef25
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS26
TITLE: Design and test of certifiable ASICs for safety-critical gas burners control
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS27
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS28
TITLE: Teaching microelectronic-based integrated systems design and test
AUTHORS: Gonçalves, FM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
AUTHORS: Gonçalves, FM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
INDEXED IN: Scopus
Scopus29
TITLE: LAYOUT-LEVEL TECHNIQUES FOR TESTABILITY IMPROVEMENT OF MOS PHYSICAL DESIGNS
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
INDEXED IN: WOS
WOS30
TITLE: High-quality physical designs of CMOS ICs
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
INDEXED IN: Scopus
Scopus