João Paulo Cacho Teixeira
AuthID: R-000-7A4
151
TÃTULO: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2002, FONTE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2002, FONTE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
152
TÃTULO: Optimizing functional distribution in complex system design
AUTORES: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLICAÇÃO: 2001, FONTE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
AUTORES: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLICAÇÃO: 2001, FONTE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXADO EM: 
Scopus 
WOS
Scopus WOS153
TÃTULO: RTL design validation, DFT and test pattern generation for high defects coverage
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
WOS154
TÃTULO: Design and test of certifiable ASICs for safety-critical gas burners control
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
WOS155
TÃTULO: Test resource partitioning: a design & test issue
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
156
TÃTULO: Towards e-management as enabler for accelerated change
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXADO EM: Scopus
Scopus157
TÃTULO: RTL-based functional test generation for high defects coverage in digital SOCs
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
WOS158
TÃTULO: MOSYS: A methodology for automatic object identification from system specification
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTORES: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXADO EM: Scopus 
CrossRef
Scopus CrossRef159
TÃTULO: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
AUTORES: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLICAÇÃO: 1999, FONTE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, NÚMERO: 1-2
160
TÃTULO: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTORES: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLICAÇÃO: 1999, FONTE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXADO EM: WOS
WOS