João Pedro Abreu de Oliveira
AuthID: R-000-7CS
1
TÃTULO: Analysis and Design of ULV DIGOTAs in 16 nm CMOS FinFET
AUTORES: Ricardo MacHado; Pedro Toledo; Luís Bica Oliveira; Miguel Máximo; Mauro Santos; João Oliveira; Paolo Stefano Crovetti;
PUBLICAÇÃO: 2025, FONTE: 2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025 in Proceedings - IEEE International Symposium on Circuits and Systems
AUTORES: Ricardo MacHado; Pedro Toledo; Luís Bica Oliveira; Miguel Máximo; Mauro Santos; João Oliveira; Paolo Stefano Crovetti;
PUBLICAÇÃO: 2025, FONTE: 2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025 in Proceedings - IEEE International Symposium on Circuits and Systems
2
TÃTULO: Is There a ZTC biasing Point in the Leading-Edge FET Intrinsic Gain gmrDS ?
AUTORES: Coelho, Miguel; Martins, Rafael; Toledo, Pedro; Matos, Alexandra; Ferreira, Rafael; Subrahmanyam, Boyapati; Oliveira, Luis B.; Augusto, Jose Soares ; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
AUTORES: Coelho, Miguel; Martins, Rafael; Toledo, Pedro; Matos, Alexandra; Ferreira, Rafael; Subrahmanyam, Boyapati; Oliveira, Luis B.; Augusto, Jose Soares ; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
3
TÃTULO: A Robustness Analysis of Hot Spots Bias Points on the FinFET: A Simulation-Based Approach
AUTORES: Martins, Rafael; Coelho, Miguel; Toledo, Pedro; Matos, Alexandra; Ferreira, Rafael; Subrahmanyam, Boyapati; Oliveira, Luis B.; Augusto, Jose Soares ; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
AUTORES: Martins, Rafael; Coelho, Miguel; Toledo, Pedro; Matos, Alexandra; Ferreira, Rafael; Subrahmanyam, Boyapati; Oliveira, Luis B.; Augusto, Jose Soares ; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
4
TÃTULO: High-Level Modeling of RF Power Amplifiers and Antenna Arrays for Efficient Over-the-Air Power Combination in RF Transceivers
AUTORES: Marius Diacu; João Guerreiro; Joǎo Oliveira; Montezuma De Carvalho, P; Pedro Viegas;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2025 in 2025 32nd International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
AUTORES: Marius Diacu; João Guerreiro; Joǎo Oliveira; Montezuma De Carvalho, P; Pedro Viegas;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2025 in 2025 32nd International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
5
TÃTULO: Optimum Design of a Mostly -Digital Fleischer-Laker Switched -Capacitor Bilinear Bandpass Filter in Standard CMOS Technology
AUTORES: Serra, Hugo; Oliveira, Joao Pedro; Goes, Joao;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System-MIXDES-Annual in 2025 32ND INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM, MIXDES
AUTORES: Serra, Hugo; Oliveira, Joao Pedro; Goes, Joao;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System-MIXDES-Annual in 2025 32ND INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEM, MIXDES
6
TÃTULO: The Case for Switched-Mode Transmitter Architectures in Efficient 5G/6G Mobile Networks Based on Power Amplifier Survey
AUTORES: Diacu, Marius; Oliveira, Joao P.; Guerreiro, Joao;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
AUTORES: Diacu, Marius; Oliveira, Joao P.; Guerreiro, Joao;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
7
TÃTULO: Comparative Study of Quantized CNN Inference on ARM and RISC-V Microcontrollers
AUTORES: Juliao, Andre; Rombo, Goncalo; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
AUTORES: Juliao, Andre; Rombo, Goncalo; Oliveira, Joao P.;
PUBLICAÇÃO: 2025, FONTE: 9th 8th International Young Engineers Forum on Electrical and Computer Engineering-YEF-ECE in 2025 9TH INTERNATIONAL YOUNG ENGINEERS FORUM ON ELECTRICAL AND COMPUTER ENGINEERING, YEF-ECE
8
TÃTULO: Machine learning methods, applications and economic analysis to predict heart failure hospitalisation risk: a scoping review protocol Full Text
AUTORES: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLICAÇÃO: 2024, FONTE: BMJ OPEN, VOLUME: 14, NÚMERO: 4
AUTORES: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLICAÇÃO: 2024, FONTE: BMJ OPEN, VOLUME: 14, NÚMERO: 4
INDEXADO EM: 
Scopus 
WOS
Scopus WOS9
TÃTULO: Quality of reconstituted tailings samples based on their mechanical response
AUTORES: Oliveira, Joao; Coelho, Paulo; Santos, Luis Araujo ;
PUBLICAÇÃO: 2024, FONTE: 8th International Symposium on Deformation Characteristics of Geomaterials (IS-Porto) in PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON DEFORMATION CHARACTERISTICS OF GEOMATERIALS, IS-PORTO 2023, VOLUME: 544
AUTORES: Oliveira, Joao; Coelho, Paulo; Santos, Luis Araujo ;
PUBLICAÇÃO: 2024, FONTE: 8th International Symposium on Deformation Characteristics of Geomaterials (IS-Porto) in PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON DEFORMATION CHARACTERISTICS OF GEOMATERIALS, IS-PORTO 2023, VOLUME: 544
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TÃTULO: Quantized Digital Amplification Physical Layer Security Schemes
AUTORES: Viegas, Pedro; Montezuma, Paulo; Dinis, Rui; Guerreiro, Joao; Oliveira, Joao Pedro;
PUBLICAÇÃO: 2024, FONTE: 15th Advanced Doctoral Conference on Computing Electrical and Industrial Systems-DoCEIS in TECHNOLOGICAL INNOVATION FOR HUMAN-CENTRIC SYSTEMS, DOCEIS 2024, VOLUME: 716
AUTORES: Viegas, Pedro; Montezuma, Paulo; Dinis, Rui; Guerreiro, Joao; Oliveira, Joao Pedro;
PUBLICAÇÃO: 2024, FONTE: 15th Advanced Doctoral Conference on Computing Electrical and Industrial Systems-DoCEIS in TECHNOLOGICAL INNOVATION FOR HUMAN-CENTRIC SYSTEMS, DOCEIS 2024, VOLUME: 716
