João Pedro Abreu de Oliveira
AuthID: R-000-7CS
1
TÃTULO: Analysis and Design of ULV DIGOTAs in 16 nm CMOS FinFET
AUTORES: Ricardo MacHado; Pedro Toledo; Luís Bica Oliveira; Miguel Máximo; Mauro Santos; João Oliveira; Paolo Stefano Crovetti;
PUBLICAÇÃO: 2025, FONTE: 2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025 in Proceedings - IEEE International Symposium on Circuits and Systems
AUTORES: Ricardo MacHado; Pedro Toledo; Luís Bica Oliveira; Miguel Máximo; Mauro Santos; João Oliveira; Paolo Stefano Crovetti;
PUBLICAÇÃO: 2025, FONTE: 2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025 in Proceedings - IEEE International Symposium on Circuits and Systems
2
TÃTULO: Is There a ZTC Biasing Point in the Leading-Edge FET Intrinsic Gain gmrDS?
AUTORES: Miguel Coelho; Rafael Martins; Pedro Toledo; Alexandra Matos; Rafael Ferreira; Boyapati Subrahmanyam; Luís Bica Oliveira; José Soares Augusto; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
AUTORES: Miguel Coelho; Rafael Martins; Pedro Toledo; Alexandra Matos; Rafael Ferreira; Boyapati Subrahmanyam; Luís Bica Oliveira; José Soares Augusto; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
3
TÃTULO: A Robustness Analysis of Hot Spots Bias Points on the FinFET: A Simulation-Based Approach
AUTORES: Rafael Martins; Miguel Coelho; Pedro Toledo; Alexandra Matos; Rafael Ferreira; Boyapati Subrahmanyam; Luís Bica Oliveira; José Soares Augusto; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
AUTORES: Rafael Martins; Miguel Coelho; Pedro Toledo; Alexandra Matos; Rafael Ferreira; Boyapati Subrahmanyam; Luís Bica Oliveira; José Soares Augusto; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
4
TÃTULO: High-Level Modeling of RF Power Amplifiers and Antenna Arrays for Efficient Over-the-Air Power Combination in RF Transceivers
AUTORES: Marius Diacu; João Guerreiro; Joǎo Oliveira; Montezuma De Carvalho, P; Pedro Viegas;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2025 in 2025 32nd International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
AUTORES: Marius Diacu; João Guerreiro; Joǎo Oliveira; Montezuma De Carvalho, P; Pedro Viegas;
PUBLICAÇÃO: 2025, FONTE: 32nd International Conference on Mixed Design of Integrated Circuits and System, MIXDES 2025 in 2025 32nd International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
5
TÃTULO: Comparative Study of Quantized CNN Inference on ARM and RISC-V Microcontrollers
AUTORES: Andre Juliao; Goncalo Rombo; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
AUTORES: Andre Juliao; Goncalo Rombo; Joǎo Oliveira;
PUBLICAÇÃO: 2025, FONTE: 9th International Young Engineers Forum on Electrical and Computer Engineering, YEF-ECE 2025 in 2025 9th International Young Engineers Forum on Electrical and Computer Engineering (YEF-ECE)
6
TÃTULO: Machine learning methods, applications and economic analysis to predict heart failure hospitalisation risk: a scoping review protocol Full Text
AUTORES: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLICAÇÃO: 2024, FONTE: BMJ OPEN, VOLUME: 14, NÚMERO: 4
AUTORES: Seringa, Joana; Abreu, Joao; Magalhaes, Teresa;
PUBLICAÇÃO: 2024, FONTE: BMJ OPEN, VOLUME: 14, NÚMERO: 4
INDEXADO EM: 
Scopus 
WOS
Scopus WOS7
TÃTULO: Quality of reconstituted tailings samples based on their mechanical response
AUTORES: Oliveira, Joao; Coelho, Paulo; Santos, Luis Araujo ;
PUBLICAÇÃO: 2024, FONTE: 8th International Symposium on Deformation Characteristics of Geomaterials (IS-Porto) in PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON DEFORMATION CHARACTERISTICS OF GEOMATERIALS, IS-PORTO 2023, VOLUME: 544
AUTORES: Oliveira, Joao; Coelho, Paulo; Santos, Luis Araujo ;
PUBLICAÇÃO: 2024, FONTE: 8th International Symposium on Deformation Characteristics of Geomaterials (IS-Porto) in PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON DEFORMATION CHARACTERISTICS OF GEOMATERIALS, IS-PORTO 2023, VOLUME: 544
8
TÃTULO: Quantized Digital Amplification Physical Layer Security Schemes
AUTORES: Viegas, Pedro; Montezuma, Paulo; Dinis, Rui; Guerreiro, Joao; Oliveira, Joao Pedro;
PUBLICAÇÃO: 2024, FONTE: 15th Advanced Doctoral Conference on Computing Electrical and Industrial Systems-DoCEIS in TECHNOLOGICAL INNOVATION FOR HUMAN-CENTRIC SYSTEMS, DOCEIS 2024, VOLUME: 716
AUTORES: Viegas, Pedro; Montezuma, Paulo; Dinis, Rui; Guerreiro, Joao; Oliveira, Joao Pedro;
PUBLICAÇÃO: 2024, FONTE: 15th Advanced Doctoral Conference on Computing Electrical and Industrial Systems-DoCEIS in TECHNOLOGICAL INNOVATION FOR HUMAN-CENTRIC SYSTEMS, DOCEIS 2024, VOLUME: 716
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TÃTULO: IEEE SSCS-EDS ESSCIRC-ESSDERC 2023 [Conference Reports] Full Text
AUTORES: Joao Goes; Jose De La Rosa; Andreia Cathelin; Jorge Fernandes; Joao Oliveira; Luis Bica De Oliveira; Nuno Paulino;
PUBLICAÇÃO: 2024, FONTE: IEEE Solid-State Circuits Magazine, VOLUME: 16, NÚMERO: 1
AUTORES: Joao Goes; Jose De La Rosa; Andreia Cathelin; Jorge Fernandes; Joao Oliveira; Luis Bica De Oliveira; Nuno Paulino;
PUBLICAÇÃO: 2024, FONTE: IEEE Solid-State Circuits Magazine, VOLUME: 16, NÚMERO: 1
10
TÃTULO: A Standard-Cell-Based Neuro-Inspired Integrate-and-Fire Analog-to-Time Converter for Biological and Low-Frequency Signals - Comparison With Analog Version Full Text
AUTORES: Teixeira, Miguel Lima; Oliveira, Joao P.; Principe, Jose C.; Goes, Joao;
PUBLICAÇÃO: 2024, FONTE: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, VOLUME: 18, NÚMERO: 4
AUTORES: Teixeira, Miguel Lima; Oliveira, Joao P.; Principe, Jose C.; Goes, Joao;
PUBLICAÇÃO: 2024, FONTE: IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, VOLUME: 18, NÚMERO: 4
