ProfileOfResearchers

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TÃTULO: Time Management for Low-Power Design of Digital Systems
AUTORES: Jorge Semião ; Freijedo, JF; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2008, FONTE: Journal of Low Power Electronics, VOLUME: 4, NÚMERO: 3

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TÃTULO: Enhancing the tolerance to power-supply instability in digital circuits
AUTORES: Jorge Semião ; Freijedo, J; Rodriguez J R Andina; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2007, FONTE: IEEE-Computer-Society Annual Symposium on VLSI in IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: EMERGING VLSI TECHNOLOGIES AND ARCHITECTURES

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TÃTULO: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTORES: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2007, FONTE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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TÃTULO: Improving tolerance to power-supply and temperature variations in synchronous circuits
AUTORES: Jorge Semião ; Freijedo, J; Rodiriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2007, FONTE: 10th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

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TÃTULO: On-line dynamic delay insertion to improve signal integrity in synchronous circuits
AUTORES: Jorge Semião ; Freijedo, J; Rodriguez Andina, JJ; Vargas, F; Santos, MB ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2007, FONTE: 13th IEEE International On-Line Testing Symposium in 13TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM PROCEEDINGS

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TÃTULO: Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes
AUTORES: Rodriguez Irago, M; Andina, JJR; Vargas, F; Jorge Semião ; Teixeira, IC ; Teixeira, JP ;
PUBLICAÇÃO: 2006, FONTE: IOLTS 2006: 12th IEEE International On-Line Testing Symposium in Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium, VOLUME: 2006

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TÃTULO: Functional-oriented BIST of sequential circuits aiming at dynamic faults coverage
AUTORES: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLICAÇÃO: 2006, FONTE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006

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TÃTULO: Functional-oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage
AUTORES: Guerreiro, F; Jorge Semião ; Pierce, A; M.B Santos; I.M Teixeira;
PUBLICAÇÃO: 2006, FONTE: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems

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TÃTULO: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTORES: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS

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