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TITLE: A Simple Method to Extract Trapping Time Constants of GaN HEMTs
AUTHORS: Luis C Nunes; Joao L Gomes; Pedro M Cabral; Jose C Pedro ;
PUBLISHED: 2018, SOURCE: IEEE/MTT-S International Microwave Symposium in 2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS
INDEXED IN: WOS
22
TITLE: Efficiency Degradation Analysis in Wideband Power Amplifiers
AUTHORS: Luis Cotimos Nunes; Diogo R Barros; Pedro M Cabral; Jose C Pedro ;
PUBLISHED: 2018, SOURCE: IEEE-MTT-Society International Microwave Symposium (IMS) in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 66, ISSUE: 12
INDEXED IN: WOS
23
TITLE: Trapping behavior of GaN HEMTs and its implications on class B PA bias point selection. Trapping Behavior of GaN HEMTs-Implications on Bias Point Selection  Full Text
AUTHORS: Cabral, PM; Nunes, LC; Ressurreicao, T; Pedro, JC ;
PUBLISHED: 2017, SOURCE: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, VOLUME: 30, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 1
24
TITLE: Compensation of Long-Term Memory Effects on GaN HEMT-Based Power Amplifiers
AUTHORS: Barradas, FM; Nunes, LC; Cunha, TR; Lavrador, PM; Cabral, PM; Pedro, JC ;
PUBLISHED: 2017, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 65, ISSUE: 9
INDEXED IN: WOS CrossRef: 16
25
TITLE: Modeling PA linearity and efficiency in MIMO transmitters
AUTHORS: Barradas, FM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLISHED: 2017, SOURCE: IEEE-Microwave-Theory-and-Techniques-Society International Microwave Symposium (IMS) / Session on Women in Microwaves (WIM) in 2017 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
INDEXED IN: Scopus WOS
26
TITLE: Power, Linearity, and Efficiency Prediction for MIMO Arrays With Antenna Coupling
AUTHORS: Barradas, FM; Tome, PM; Gomes, JM; Cunha, TR; Cabral, PM; Pedro, JC ;
PUBLISHED: 2017, SOURCE: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, VOLUME: 65, ISSUE: 12
INDEXED IN: WOS CrossRef: 14
27
TITLE: AM/PM distortion physical origins in Si LDMOS Doherty power amplifiers
AUTHORS: Nunes, LC; Cabral, PM; Pedro, JC ;
PUBLISHED: 2016, SOURCE: 2016 IEEE MTT-S International Microwave Symposium, IMS 2016 in IEEE MTT-S International Microwave Symposium Digest, VOLUME: 2016-August
INDEXED IN: Scopus CrossRef
28
TITLE: AM/PM Distortion Physical Origins in Si LDMOS Doherty Power Amplifiers
AUTHORS: Luis C Nunes; Pedro M Cabral; Jose C Pedro ;
PUBLISHED: 2016, SOURCE: IEEE MTT-S International Microwave Symposium (IMS) in 2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
INDEXED IN: WOS
29
TITLE: Motivating First Year Students for an Engineering Degree
AUTHORS: Pedro Fonseca; Paulo Pedreiras; Pedro Cabral; Joao Nuno Matos; Bernardo Cunha; Filipe Silva;
PUBLISHED: 2016, SOURCE: 2nd International Conference of the Portuguese-Society-for-Engineering-Education (CISPEE) in 2016 2ND INTERNATIONAL CONFERENCE OF THE PORTUGUESE SOCIETY FOR ENGINEERING EDUCATION (CISPEE)
INDEXED IN: WOS
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